PCA Reference Data and Services
Toggle Dark/Light/Auto modeToggle Dark/Light/Auto modeToggle Dark/Light/Auto modeBack to homepage
  2. /
  3. Reference Data Library
  4. /
  5. ISO 15926-4 Edition 3
  6. /
  7. SCANNING ELECTRON MICROSCOPY

SCANNING ELECTRON MICROSCOPY

A class with identifier http://staging4.data.posccaesar.org/iso/15926-4/rdl/RDS9700532

MetadataThis section provides information about 'RDS9700532'.

Definition<SCANNING ELECTRON MICROSCOPY> is <ELECTRON MICROSCOPY> by which the beam of focused electrons moves across the object with the secondary electrons produced by the object and the electrons scattered by the object being collected to form three-dimensional image on a cathode-ray tube
ISO number1549
RDS numberRDS9700532
SourceActivity or Event

AlignmentThis section lists the most specific P2-superclasses of 'RDS9700532' together with an alignment with corresponding classes in P14, if available.

Activitylis14:Activity

ContextThis section provides super- and subclasses of 'RDS9700532'.